Turnkey Service
 Bumping Manufacturing  Service
Gold Bumping Service
 
- Gold Bump
Solder Bumping Service
 
- Solder Bump
- Solder Bump with Ball mount
Copper Bumping Service
 
- Copper Pillar with Lead Free Solder Cap
  Redistribution Layer (RDL)  Service
Gold(Au) RDL
Thick Copper(Cu) RDL
 Wafer Surface Processing  Service
Back Side Metal Process
Dielectric Layer Coating Process
 Wafer Grinding, Dicing and Pick & Place (for COG...etc) Service
 Package & Test Service
Driver IC Testing
Non-Driver IC Testing
Driver IC Package Service(COF)
Wafer Level Chip Scale Packages (Tape & Reel) Service
Smart card & RFID Inlay module Assembly & final testing service
 Final Inspection and Failure  Analysis Service
 Certificate
 
Home Products & Services Wafer Grinding, Dicing and Pick & Place (for COG...etc) Service
 
 
 
COG is an advanced technology to adhere IC chips onto the circuit boards. By Flip Chip technology, a gold bumped IC chip is connected to the ITO of LCD panels with ACF as a media. When this technology is applied to TFT-LCD panels due to the circuit board being glass, it is so-called Chip on Glass (COG). COG would be produced by means of wafer to tray. After LCD panel module factory acquires IC, the gold bump of the IC is jointed to the circuit board of LCD panels with the adhesive agent.
 
 
 
 
2.1 The plain monitor (LCD Panel, PDP Panel or OLED Panel………) driver IC package
 
 
 
 
Process Description Note
Grinding The grinding process is to make the wafer thinner. The current process is used In feed grinding process. A blue tape is adhered on the front side of the wafer, then grind the back of the wafer with the diamond discs which is different from CMP process for the front side of wafer. Applications:
Driver IC, Flash Memory, Finger Print Sensor, RFID, LED driver, Consumer IC, CSP, CMOS
Dicing Dicing is the process to saw the wafer into individual ICs. Applications:
Driver IC, Flash Memory, Finger Print Sensor, RFID, LED driver, Consumer IC, CSP, CMOS
Pick and Place P&P is to pick up the IC from a diced wafer onto a waffle tray.  
Visual Inspection Visually examine the picked IC for cracks and chipped ICs Examined under microscope
Packing Pick and pack the waffle trays as customer specified.  
 
 
 
 
 
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